#1830 Scanning Electron Microscope | Components And Accessories Test Equipment Optical Instruments

1830

Scanning Electron Microscope

NSN 6650-01-316-1191

DEMIL
Shelf Life
UOM
NIIN
Demil:
DEMIL/MLI
Shelf Life:
N/A
UOM:
1 EA
NIIN:
013161191

Detail Specifications

General Description:
Digital imaging; computerr controlled; used for microcircuit failure analysis; c/o electron optical console: electron optical column, specimen chamber, specimen stage, vacuum system andvibration isolation system, and electronics and display console: main control panel, display and record camera system plus electronic components
NSN:
6650-01-316-1191
Item Name:
Microscope,electron,scanning
Cage Code:
33511

Manufacturer Part Numbers

No other part numbers with same form, fit, and function found.

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Catalog Drilldown
--- Instruments And Laboratory Equipment
------ Components And Accessories Test Equipment Optical Instruments
--------- Scanning Electron Microscopes
------------ P/N 1830

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Last Updated: 08/01/2025