NSN 5961-01-653-1219

Semiconductor Device Assembly

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

NIIN:

016531219

Pricing & Availability

Submit this form for current pricing and availability quote on part number and/or cross reference parts.

Definition Definition of approved item name (AIN): "SEMICONDUCTOR DEVICE ASSEMBLY"

A grouping of two or more semiconducting devices such as light emitting diode; semiconductor device, diode; semiconductor device, photo; semiconductor device, thyristor; and/or transistor mounted on a common mounting or mounted on each other. The devices must be separable and each item must be capable of functioning in accordance with its given name. For assemblies consisting of semiconducting devices permanently cased, encapsulated, or potted together to form a single unit, see rectifier, semiconductor device, unitized and semiconductor devices, unitized. Excludes semiconductor device set; microcircuit assembly; and microcircuit set. See also absorber, overvoltage.

5961-01-653-1219 Spec. NSN part characteristics

MRC

Name

Detail

MRC:

AGAV

End Application

Light emitting diode precision approach path ind. (led papi)

MRC:

CXCY

Part Name Assigned By Controlling Agency

Photosensor assembly

Cross Reference Parts Part numbers that meet the specification outlined on this page and set by the OEM

Part Number

Cage

RNCC

RNVC

DAC

RNAAC

Status

MSDS

SADC

Part Number:

93001474-01

Cage Code:

7X100

RNCC:

RNVC:

DAC:

RNAAC:

Status:

MSDS:

SADC:

Indicates a design/source control reference item

Inidicates part number has been superseded

Identification Item Identification Guide (IIG) and Item Name Code (INC)

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

35565

FIIG:

T01200

Concept No.:

App. Key:

Cond. Code:

Status:

Part End Users MOE: Major organizational entities

Name

MOE Code

MOE Rule

PICA

DSOR

User:

Federal Aviation Administration

MOE:

Rule:

B482

PICA:

DSOR:

Material & Special Handling Hazmat, Precious Metals, Criticality, Enviroment, and ESD

HMIC

PMIC

ESD

ENAC

ADPE

CRITL

HMIC:

PMIC:

ESD:

ADPE:

CRITL:

Hazmat (HMIC) N

Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.

Precious Metals (PMIC) A

Item does not contain precious metal.

Electrostatic Discharge (ESD) D

Represents items with both esd and emi sensitivity.

ADPE 0

Represents items with no adp components

Criticality X

The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.

Identification Codes

HMIC: Hazardous Material Indicator Code. Identifies a hazardous item.

PMIC: Precious Metal Indicator Code. Identifies items that have precious metals as part of their content. precious metals are those metals generally considered to be uncommon, highly valuable, and relatively superior in certain properties such as resistance to corrosion and electrical conductivity.

ESD: Electrostatic Discharge. Indicates if an item is susceptible to electrostatic discharge or electromagnetic interference damage. electrostatic discharge damage occurs when an accumulation of static electricity generated by the relative motion or separation of materials is released to another item by direct contact. electromagnetic interference damage occurs when an item comes into proximity with an electrostatic or magnetic field.

ENAC: Enviromental Attribute Code. Identifies items with environmentally preferred characteristics.

CRITL: Criticality Indicator Code. Indicates an item is technically critical by tolerance, fit, application, nuclear hardness properties, or other characteristics.