08485-60007MFG.SITE

Test Probe

NSN 6625-01-413-4326

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

014134326

Product Features

Weapon system essential

Technical Specifications of NSN

End Application:

Kilauea class t-ae26, ticonderoga class cg (47), forrestal class cv, oliver perry class ffg, spruance class dd (963), los angeles class ssn (688), wasp class lhd, arleigh burke class ddg, nimitz class cvn, mine countermeasures support (mcs) class (lph-12).

Criticality Code Justification:

Feat

Special Test Features:

Drawing iaw dod-std-100

Fsc Application Data:

Test set, elect. Equip.

NSN:

6625-01-413-4326

Item Name:

Probe Head Assembly

Cage Code:

50440

Other Related Parts

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

08485-60007

Cage Code:

1LQK8

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

08485-60007

Cage Code:

1MY97

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

08485-60007

Cage Code:

5B962

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

08485-60007

Cage Code:

28480

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39886

FIIG:

T228-H

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

0.7000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

133300

UFC:

63220

LTL:

RATING VARIABLE

LCL:

WCC:

652

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Probe Head Assembly"

An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes probe-lead assembly, test and test probe attachment.