095652X

Test Probe

NSN 6625-01-062-8248

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

010628248

Product Features

Rectangular hole tip; gold plated beryllium copper; largest cross sect. Of terminal 0.020 in.

Technical Specifications of NSN

Overall Length:

1.750 inches

Overall Diameter:

0.350 inches

Handle Material:

Polyamide nylon

Tip Termination Type:

Hook

Tip Replaceability Feature:

Not included

Color:

Red

NSN:

6625-01-062-8248

Item Name:

Test Probe To Banana Jack

Cage Code:

K7005

Other Related Parts

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

XMRED

Cage Code:

08505

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

XM1(RED)

Cage Code:

08505

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

095652X

Cage Code:

K1672

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

33-9544

Cage Code:

K2490

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39886

FIIG:

T228-H

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

0.1000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Test Probe To Banana Jack"

An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes probe-lead assembly, test and test probe attachment.