0.299 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5990-01-426-7350
NSN 6610-01-092-5375
NSN 7035-00-312-3055
NSN 5835-01-584-8538
NSN 6150-01-367-3093
NSN 5855-01-652-4934
NSN 5945-00-661-0506
NSN 5975-00-710-7099
NSN 6645-01-237-7876
NSN 6150-01-539-7876
NSN 5925-00-421-3012
NSN 6645-01-367-1316