Probe assembly. Rechii, 0.341 in. Dia. Tip
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6135-01-386-5709
NSN 5915-01-067-3536
NSN 5855-01-388-2424
NSN 5920-01-410-7740
NSN 6145-01-306-9133
NSN 6610-01-642-0258
NSN 6240-00-286-0742
NSN 5960-01-528-1147
NSN 5905-00-691-9046
NSN 6645-01-394-5149
NSN 7035-00-763-6180
NSN 5990-00-794-5870