Probe assembly. Rechii, 0.341 in. Dia. Tip
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 2925-00-716-9596
NSN 5930-00-252-9493
NSN 5855-01-020-7982
NSN 5960-01-432-6038
NSN 6650-01-069-2501
NSN 6150-00-389-6771
NSN 5998-00-820-5818
NSN 6145-01-546-8556
NSN 5965-01-345-9480
NSN 4140-00-621-2918
NSN 5990-01-048-1056
NSN 6105-00-253-9279