Probe assembly, rechii; 0.354 in. Tip diameter
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6130-01-511-8499
NSN 6610-01-152-9240
NSN 5975-00-840-5844
NSN 5905-01-109-4104
NSN 5855-00-079-2370
NSN 5999-01-406-3161
NSN 5996-00-905-6610
NSN 5945-00-462-1789
NSN 5950-01-028-0968
NSN 6685-00-481-9852
NSN 6685-01-350-3451
NSN 6105-01-520-8237