Probe assembly, rechii; 0.354 in. Tip diameter
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6105-01-333-3188
NSN 6105-01-381-7242
NSN 6645-01-400-2119
NSN 6320-01-309-9595
NSN 5950-00-334-3011
NSN 5960-01-481-3722
NSN 5835-01-426-6573
NSN 5935-00-424-9979
NSN 6645-01-420-6804
NSN 5999-00-905-6936
NSN 6650-01-200-7657
NSN 5975-01-459-5410