Probe assembly rechii; 0.482 in. Tip diameter
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5960-00-266-6741
NSN 5998-00-951-0789
NSN 6610-01-360-3564
NSN 6685-01-055-5919
NSN 5999-00-274-3434
NSN 6610-01-400-3880
NSN 5998-01-555-0374
NSN 5975-01-085-4892
NSN 5975-01-642-4195
NSN 5910-00-683-3982
NSN 5835-00-880-6477
NSN 5990-01-530-8452