115378

Guided Missile Test Set

NSN 4935-01-253-8696

DEMIL
Shelf Life
UOM
NIIN
Demil:
DEMIL/MLI
Shelf Life:
UOM:
NIIN:
012538696

Technical Specifications of NSN

NSN:
4935-01-253-8696
Item Name:
Common Field Level Memory Reprogramming
Cage Code:
24039

Other Related Parts

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
03642
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

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Definition Definition of approved item name (AIN): "Common Field Level Memory Reprogramming"

A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.

MOE Major Organizational Entities

Entity
DSOR
User:
AUSTRALIA Australia
DSOR:
User:
CANADA Canada
DSOR:
Import / Export
  • Schedule B: 9306900020
  • SITC: 89129
  • End Use: Tanks, artillery, missiles, rockets, guns and ammunition
  • NAICS: 336414
  • USDA: 1

Classification: Guided missles


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