0.424 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 7035-01-514-4617
NSN 5998-00-907-1857
NSN 5920-01-005-6389
NSN 5895-01-553-5403
NSN 5920-01-510-2784
NSN 6620-00-912-0255
NSN 5996-01-034-4694
NSN 7035-01-150-6303
NSN 5965-00-156-8562
NSN 6130-01-400-1385
NSN 5996-00-168-8543
NSN 6220-01-597-9882