A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 6110-01-144-2832
NSN 5895-01-354-2260
NSN 5895-01-403-2793
NSN 5965-01-025-5129
NSN 6320-01-176-8367
NSN 5835-00-245-9453
NSN 5835-00-003-0295
NSN 4140-01-577-0245
NSN 5855-01-540-1185
NSN 5910-01-053-3969
NSN 5990-01-363-5321
NSN 6645-01-227-2036