A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 5905-00-582-1356
NSN 5835-01-528-7454
NSN 5925-01-421-4473
NSN 5975-01-466-6326
NSN 7035-01-158-8860
NSN 6645-00-339-0318
NSN 5855-01-050-0861
NSN 6645-01-062-6212
NSN 6240-01-550-5158
NSN 6240-01-362-2467
NSN 6220-01-502-9451
NSN 5925-01-539-6974