A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 6220-00-857-7565
NSN 6150-01-212-3003
NSN 5999-01-263-3657
NSN 6645-00-287-9192
NSN 5915-00-127-3102
NSN 6150-01-160-7536
NSN 5910-01-005-2612
NSN 5998-01-423-1743
NSN 6645-01-367-7609
NSN 5835-00-503-2608
NSN 6145-00-372-3713
NSN 5835-00-378-1429