1400M77P04

Eddy Current Probe

NSN 6635-01-311-8997

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
N/A
UOM:
1 EA
NIIN:
013118997

Detail Specifications

Overall Length:
0.750 inches
Overall Diameter:
0.189 inches
Tip Termination Type:
Any acceptable
NSN:
6635-01-311-8997
Item Name:
Mechanical Impedance Analysis Probe
Cage Code:
66464

Manufacturer Part Numbers

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
SGE400R1
Cage Code:
29192
RNCC:
3
RNVC:
2
RNAAC:
CX
Status:
A
MSDS:
SADC:
Part Number:
SGE400R1
Cage Code:
51294
RNCC:
5
RNVC:
2
RNAAC:
ZZ
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
36329
FIIG:
T228-H
Concept No.:
App. Key:
HA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
MMAC:
TG
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
--
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
00
LVL_A:
E
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
058240
UFC:
33170
LTL:
150.0
LCL:
--
WCC:
72B
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Pricing & Availability

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Privacy | Terms

Definition Definition of approved item name (AIN): "Mechanical Impedance Analysis Probe"

An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE AIR FORCE Dept. of the Air Force
DSOR:
User:
POLAND Poland
DSOR:
Import / Export
  • Schedule B: 9027509000
  • SITC: 87445
  • End Use: Laboratory testing instruments
  • NAICS: 334516
  • USDA: 1

Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi


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