A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6320-01-441-2438
NSN 6685-01-525-5260
NSN 5920-01-317-3506
NSN 5998-01-357-5570
NSN 5910-00-740-7286
NSN 6130-01-206-0420
NSN 5965-01-362-9609
NSN 5930-01-270-6998
NSN 5950-00-248-5674
NSN 6145-01-200-6377
NSN 5915-00-269-4463
NSN 6135-00-062-5080