A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5925-01-411-6028
NSN 6145-01-309-7827
NSN 6610-00-315-9315
NSN 5996-01-322-4838
NSN 6650-01-329-6350
NSN 5905-00-525-3747
NSN 5998-01-040-0886
NSN 5965-00-931-6299
NSN 5935-01-193-0105
NSN 5965-01-060-2558
NSN 2925-01-150-7160
NSN 4140-00-052-4815