A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5950-01-580-0598
NSN 5985-00-551-3244
NSN 7035-00-140-3070
NSN 5996-01-494-5896
NSN 6150-00-827-1949
NSN 5960-00-762-0553
NSN 5925-01-156-0361
NSN 6150-01-092-5188
NSN 5998-01-400-4079
NSN 5998-01-411-5496
NSN 5975-01-518-3908
NSN 5975-00-141-0531