A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5990-00-912-3737
NSN 5910-01-206-3474
NSN 2925-01-397-8028
NSN 7035-01-038-3165
NSN 6145-01-580-0334
NSN 6145-01-034-3534
NSN 6220-00-162-3730
NSN 7035-00-922-5700
NSN 5905-00-855-8022
NSN 6135-01-214-6441
NSN 5965-01-278-2107
NSN 5920-00-466-3950