A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6320-00-779-5923
NSN 5985-01-003-9732
NSN 5998-00-876-0740
NSN 5925-01-654-2255
NSN 6105-01-634-0322
NSN 5945-00-111-2050
NSN 5895-00-847-7798
NSN 6105-00-248-5772
NSN 5950-01-374-5990
NSN 6150-00-930-8919
NSN 5998-01-519-9273
NSN 5965-01-434-8759