A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 6150-01-634-0575
NSN 5895-01-009-2830
NSN 5990-01-411-5930
NSN 5965-00-170-5254
NSN 5960-01-265-8069
NSN 6240-01-376-2056
NSN 5945-01-162-6362
NSN 6645-01-063-8243
NSN 6685-01-260-9156
NSN 5855-01-156-0417
NSN 6610-01-395-3510
NSN 6220-01-573-8784