39013

Semiconductor Device Test Set

NSN 6625-00-504-1949

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

005041949

Product Features

Accepts ceramic cartridge and coaxial types of both normal and reversed polarities; remote test jack permits testing crystals w/o removing them from receiver

Product Technical Spec.

Width:

6.000 inches

Length:

6.000 inches

Dc Voltage Rating:

1.5 volts

Internal Battery Accommodation:

Included

Material And Location:

Aluminum carrying case

Inclosure Feature:

Single item w/carrying case

Test Type For Which Designed:

Vto measure the relative noise figure of microwave mixer crystals, to obtain an approximate impedance check for selecting matched crystals, for use in balance mixers, to measure the relative sensitivity of microwave detector crystals

Operating Test Capability:

Silicon mixer crystals, range 0 to 10000 mc, porm 1/2 db on conversion loss, porm 0.5 db on noise temp

Height:

3.000 inches

NSN:

6625-00-504-1949

Item Name:

Test Set,crystal Diode

Cage Code:

00752

Cross Referenced Parts

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

390A

Cage Code:

00752

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

390A3

Cage Code:

00752

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

25006

FIIG:

T228-A

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

8.3 X 8.3 X 4.5

Paclk Weight:

2.5000lbs

Item Weight:

1.5000lbs

Item Dim:

006800300065

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

F000002E12

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

77.5

WCC:

653

TCC:

SHC:

ACC:

Equipment for Aircraft

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Pricing & Availability

Submit this form for current pricing and availability quote on part number 39013 and/or cross reference parts.

Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.