3

Semiconductor Device Test Set

NSN 6625-00-926-1341

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
UOM:
NIIN:
009261341

Technical Specifications of NSN

Width:
6.000 inches
Length:
9.000 inches
Dc Voltage Rating:
13.5 volts
Major Components:
Adapter, transistor
Accessory Component Quantity:
1
Accessory Controlling Agency:
Test equipment corp
Accessory Identifying Number:
Ta-1 part no.
Internal Battery Accommodation:
Included
Material And Location:
Aluminum carrying case
Inclosure Feature:
Single item w/carrying case
Test Type For Which Designed:
Ac current gain; saturation; leakage current
Operating Test Capability:
Ac current gain range 3 to 100 and 30 to 1000, ac test freq 1 khz porm 10 pct of total; saturation voltage range 0.3 to 3v full scale; leakage current range 0.03, 0.3, 3 or 30 ma full scale at 6v
Height:
6.000 inches
NSN:
6625-00-926-1341
Item Name:
Test Set,crystal Diode
Cage Code:
24623

Other Related Parts

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
U
ESD:
ESD:
MMAC:
CRITL:
X

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Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
CANADA Canada
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


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