421-2399

Test Probe

NSN 6625-01-384-2811

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

013842811

Detail Specifications

End Application:

Miltimeter model fluke 87-test

NSN:

6625-01-384-2811

Item Name:

Body,probe

Cage Code:

A486G

Manufacturer Part Numbers

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

80K-6

Cage Code:

89536

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

83K8322

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

FLUKE 80K-6 CAL D

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

80K-6

Cage Code:

89536

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

83K8322

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

FLUKE 80K-6 CAL D

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

80K-6

Cage Code:

89536

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

83K8322

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

FLUKE 80K-6 CAL D

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

80K-6

Cage Code:

89536

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

83K8322

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

FLUKE 80K-6 CAL D

Cage Code:

9A102

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39886

FIIG:

T228-H

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

77.5

WCC:

738

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Probe Body"

An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes probe-lead assembly, test and test probe attachment.