435947

Guided Missile System Test Set

NSN 4935-00-097-0296

DEMIL
Shelf Life
UOM
NIIN
Demil:
DEMIL/MLI
Shelf Life:
N/A
UOM:
* special requirements. EA
NIIN:
000970296

Product Features

Includes 1 ea interconnection kit, dwg no. 2602d-5009g1; 1 ea accessory kit, dwg no. 2601b-5003g1; 1 ea interrupter cable assembly, dwg no. 50385-5072; 4 ea assembly that include 23 ea subassy as follows: console assembly dwg no. 435945; includes no.1 through 13 subassy as follows: no.1 doppler generator assembly dwg no. 435943, no. 2 buckoff assembly dwg no. 50385-5012, no.3 missile test set assembly dwg no. 435944, no.4 positive pwr supply dwg no. 2596-5017g1, no.5 frt panel assembly dwg no. 435946, no.6 pwr supply frt panel assembly dwg no. 2596-5003g1, no.7 cabinet dwg no. 2595-5029g1, no.8 negative pwr supply dwg no. 2596-5016g1, no.9 r.F.Section dwg no. 2598-5135g1, no.10 cabinet screen assembly dwg no. 2595-5003g1, no.11 servo test set assembly dwg no. 50385-5033, no.12 id plate dwg no. 435128, no.13 interconnecting diagram dwg no. 435856, roll assembly dwg no. 5038505049 includes subassy 14 through 18 as follows, no.14 stand assembly dwg no. 2600-5028, no.15 lock assembly dwg no. 50385-5013

Detail Specifications

NSN:
4935-00-097-0296
Item Name:
Test Set,guided Missile System
Cage Code:
2B487

Manufacturer Part Numbers

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
61601
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
--
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
M
SPI No.:
SPI Rev.:
SPC Mkg:
99
LVL_A:
E
LVL_B:
Q

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Pricing & Availability

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Privacy | Terms

Definition Definition of approved item name (AIN): "Guided Missile System Test Set"

A test set specifically designed for making examinations of guided missile system, including electronic components and circuits. Excludes individual test sets designed for a single specific function. Excludes test set, electronic systems.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE NAVY Dept. of the Navy
DSOR:
Import / Export
  • Schedule B: 9306900020
  • SITC: 89129
  • End Use: Tanks, artillery, missiles, rockets, guns and ammunition
  • NAICS: 336414
  • USDA: 1

Classification: Guided missles


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