5100DS

Semiconductor Device Test Set

NSN 6625-01-348-9634

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
N/A
UOM:
1 EA
NIIN:
013489634

Detail Specifications

Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Analog and digital components
NSN:
6625-01-348-9634
Item Name:
Transistor Curve Tracer
Cage Code:
57705

Manufacturer Part Numbers

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
200.0
WCC:
738
TCC:
3
SHC:
9
ACC:
Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Transistor Curve Tracer"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE AIR FORCE Dept. of the Air Force
DSOR:
CN FT
User:
BRAZIL Brazil
DSOR:
User:
AUSTRALIA Australia
DSOR:
User:
CANADA Canada
DSOR:
User:
NEW ZEALAND New Zealand
DSOR:
User:
UNITED KINGDOM United Kingdom
DSOR:
User:
GREECE Greece
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


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