5106

Test Probe

NSN 6625-01-298-1161

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

012981161

Product Technical Spec.

NSN:

6625-01-298-1161

Item Name:

Probe Head Assembly

Cage Code:

28611

Cross Referenced Parts

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

3B1B

Cage Code:

04034

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

3B1A

Cage Code:

79198

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

3B1B

Cage Code:

79198

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39886

FIIG:

T228-H

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

0.1000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

133300

UFC:

63220

LTL:

RATING VARIABLE

LCL:

WCC:

652

TCC:

SHC:

ACC:

Instruments/Radio

We Guarantee with Every Order

100% Genuine Manufacturers Parts
Every Product thoroughly Inspected
Sales Record Retention of 7 years
Fast Delivery
HAZMAT Certified
Global Shipping

Pricing & Availability

Submit this form for current pricing and availability quote on part number 5106 and/or cross reference parts.

Definition Definition of approved item name (AIN): "Probe Head Assembly"

An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes probe-lead assembly, test and test probe attachment.