A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5920-01-030-1112
NSN 4140-00-219-3146
NSN 5999-01-133-3735
NSN 6105-01-606-7555
NSN 5945-01-432-3216
NSN 5925-01-406-3490
NSN 5905-01-046-0491
NSN 6685-00-469-9323
NSN 6130-01-124-5350
NSN 5945-01-170-0553
NSN 5996-01-534-7687
NSN 5915-01-460-7176