7999

Test Probe-lead Assembly

NSN 6625-00-113-9631

DEMIL

Shelf Life

UOM

NIIN

Demil:

DEMIL/MLI

Shelf Life:

N/A

UOM:

NIIN:

001139631

Product Features

Input impedance of 10 meg; capacitance 13 pf; division ratio (v/div factor) 10/1; bandwidth 63 mhz

Detail Specifications

General Description:

9.000 ft lg; 0.171 in. Dia

Fsc Application Data:

Test set, elect. Equip.

NSN:

6625-00-113-9631

Item Name:

Clamp On Current Probe

Cage Code:

72314

Manufacturer Part Numbers

No other part numbers with same form, fit, and function found.

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39884

FIIG:

A23900

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

0.1000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Clamp On Current Probe"

A definite length of wire or cable with a clip, electrical; connector, plug, electrical; connector, receptacle, electrical; jack, telephone; jack, tip; plug, tip; or the like on one or both ends and probe, test on either end but not on both ends. Electronic components, such as capacitors, electron tube, resistors, semiconductor devices, and the like are mounted into and included with the item for attenuation or amplification purposes. May or may not include accessories such as clip, electrical; probe, test; test probe attachment. For items without electronic components see, lead, test. For items designed for direct attachment to a probe-lead assembly, test see probe, test. For items designed for indirect attachment to a probe-lead assembly, test see test probe attachment.