A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5855-00-586-6255
NSN 5996-00-234-5010
NSN 5975-01-100-3222
NSN 5855-00-466-2309
NSN 5999-01-423-9876
NSN 4140-01-207-0452
NSN 6240-01-565-6276
NSN 5945-00-036-3613
NSN 6130-01-433-2918
NSN 5965-00-661-0469
NSN 4140-01-289-4811
NSN 5835-01-641-0073