902-470

Semiconductor Device Test Set

NSN 6625-00-179-5844

DEMIL
Shelf Life
UOM
NIIN
Demil:
DEMIL/MLI
Shelf Life:
N/A
UOM:
EA
NIIN:
001795844

Technical Specifications of NSN

Width:
8.000 inches
Length:
9.000 inches
Ac Voltage Rating:
115.0 volts
Dc Voltage Rating:
Between 2.0 volts and 9.0 volts
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
Major Components:
Test set, semiconductor device; cover, test set; lead, test; prod, test
Accessory Component Quantity:
1 and 1 and 1 and 1
Accessory Controlling Agency:
Jetds and jetds and jetds and jetds
Accessory Identifying Number:
Ts-2798/usm-206a type no. And cw-1049/usm-206a type no. And cx-11898/usm-206a type no. And mx-6825a/usm-206a type no.
Joint Electronics Type Designation System Item Name:
Test, semiconductor device
Joint Electronics Type Designation System Item Type Number:
Type no. An/usm-206a
Internal Battery Accommodation:
Included
Material And Location:
Plastic carrying case
Inclosure Feature:
Single item w/carrying case
Test Type For Which Designed:
Transistor beta and transconductance measurements; diode and transistor electrode resistance; diode and transistor reverse leakage measurements; shorted or open diode test; battery tests
Operating Test Capability:
Meter; micromhos; beta; leakage test; battery test
Phase:
Single
Height:
10.000 inches
NSN:
6625-00-179-5844
Item Name:
Tester,transistor
Cage Code:
28569

Other Related Parts

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
ANUSM206A
Cage Code:
80058
RNCC:
3
RNVC:
2
RNAAC:
CL
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
13.5 X 11.8 X 10.8
Paclk Weight:
10.5000lbs
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
M
SPI No.:
SPI Rev.:
SPC Mkg:
03
LVL_A:
E
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
RATING VARIABLE
WCC:
658
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Transistor Tester"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE NAVY Dept. of the Navy
DSOR:
User:
BRAZIL Brazil
DSOR:
User:
SPAIN Spain
DSOR:
User:
KUWAIT Kuwait
DSOR:
User:
REPUBLIC OF KOREA Republic of Korea
DSOR:
User:
ITALY Italy
DSOR:
User:
GREECE Greece
DSOR:
User:
TURKEY Turkey
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


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