91542485

Test Probe

NSN 6625-01-058-9476

DEMIL

Shelf Life

UOM

NIIN

Demil:

DEMIL/MLI

Shelf Life:

N/A

UOM:

1 EA

NIIN:

010589476

Product Technical Spec.

Overall Length:

12.000 inches

Overall Diameter:

3.500 inches

NSN:

6625-01-058-9476

Item Name:

Probe,voltage

Cage Code:

F6481

Cross Referenced Parts

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

HVP250-200-1

Cage Code:

31640

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

0250-00-0026

Cage Code:

31640

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

HVP-250-1000-1

Cage Code:

31640

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

0250-00-0001

Cage Code:

31640

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

0250-00-0025

Cage Code:

31640

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39886

FIIG:

T228-H

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

2.0000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

RATING VARIABLE

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

Submit this form for current pricing and availability quote on part number 91542485 and/or cross reference parts.

Definition Definition of approved item name (AIN): "Voltage Probe"

An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes probe-lead assembly, test and test probe attachment.