9216539

Eddy Current Probe

NSN 6635-01-461-5780

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
N/A
UOM:
1 EA
NIIN:
014615780

Product Features

Pencil reflection surface probe; frequency range 1hz-100hz

Product Technical Spec.

Tip Termination Type:
Probe
NSN:
6635-01-461-5780
Item Name:
Mechanical Impedance Analysis Probe
Cage Code:
29192

Cross Referenced Parts

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
SPC-AR3-2
Cage Code:
1FYY4
RNCC:
5
RNVC:
2
RNAAC:
ZZ
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
36329
FIIG:
T228-H
Concept No.:
App. Key:
HA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
MMAC:
TG
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
--
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
00
LVL_A:
E
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
063560
UFC:
98185
LTL:
RATING VARIABLE
LCL:
--
WCC:
656
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Pricing & Availability

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Privacy | Terms

Definition Definition of approved item name (AIN): "Mechanical Impedance Analysis Probe"

An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE AIR FORCE Dept. of the Air Force
DSOR:
User:
REPUBLIC OF KOREA Republic of Korea
DSOR:
Import / Export
  • Schedule B: 9027509000
  • SITC: 87445
  • End Use: Laboratory testing instruments
  • NAICS: 334516
  • USDA: 1

Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi


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