A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 5895-01-640-7792
NSN 4140-00-751-1694
NSN 5985-01-063-2091
NSN 5835-00-155-1379
NSN 5935-00-706-3743
NSN 6135-01-652-4521
NSN 5985-00-193-3501
NSN 5965-01-265-6814
NSN 5855-00-930-6336
NSN 5965-01-655-1457
NSN 6220-00-707-5044
NSN 5965-01-316-9859