A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6620-01-332-7760
NSN 6110-00-218-0967
NSN 4140-01-568-7925
NSN 6685-01-215-6167
NSN 6135-00-246-0324
NSN 5925-00-171-0307
NSN 6130-00-105-6602
NSN 5990-00-827-0684
NSN 5835-01-158-6878
NSN 6150-00-553-7948
NSN 5935-01-191-3338
NSN 6645-01-461-6102