A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 6620-00-054-4778
NSN 5855-00-930-8828
NSN 4140-01-131-6608
NSN 5930-00-349-0099
NSN 4140-01-154-5830
NSN 5998-01-529-8493
NSN 6620-00-938-8212
NSN 6610-01-047-3522
NSN 5985-01-023-9280
NSN 5960-00-242-6053
NSN 6145-00-081-2797
NSN 5965-01-381-4879