A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a guided missile. Excludes individual test sets designed for a single specific function.
Classification: Guided missles
NSN 5998-00-489-1956
NSN 5920-01-659-1708
NSN 5920-01-262-3570
NSN 5920-01-241-3227
NSN 6645-01-481-4418
NSN 6610-00-325-0485
NSN 6145-01-415-2658
NSN 6150-01-068-4672
NSN 5895-00-827-0240
NSN 5920-01-566-9328
NSN 5835-00-148-9719
NSN 5975-00-133-9064