AV-5378

Test Probe-lead Assembly

NSN 6625-01-157-7730

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

011577730

Detail Specifications

NSN:

6625-01-157-7730

Item Name:

Switchable Probe

Cage Code:

58414

Manufacturer Part Numbers

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

PM2801

Cage Code:

62381

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

PM2801A

Cage Code:

62381

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

2801

Cage Code:

62381

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39884

FIIG:

A23900

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

0.3000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Switchable Probe"

A definite length of wire or cable with a clip, electrical; connector, plug, electrical; connector, receptacle, electrical; jack, telephone; jack, tip; plug, tip; or the like on one or both ends and probe, test on either end but not on both ends. Electronic components, such as capacitors, electron tube, resistors, semiconductor devices, and the like are mounted into and included with the item for attenuation or amplification purposes. May or may not include accessories such as clip, electrical; probe, test; test probe attachment. For items without electronic components see, lead, test. For items designed for direct attachment to a probe-lead assembly, test see probe, test. For items designed for indirect attachment to a probe-lead assembly, test see test probe attachment.