EP074-0140

Scanning Electron Micr Substrate

NSN 6640-01-406-5281

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
N/A
UOM:
1 PG
NIIN:
014065281

Product Features

Black; opaque; highly conductive; non-wetting; cfc-free barrier; each w/plastic cover wrapped in seperate plastic bag; for use in making ferrograms for examination under scanning electron microscope (sem)

Product Technical Spec.

NSN:
6640-01-406-5281
Item Name:
Substrate,scanning Electron Micr
Cage Code:
0MTU5

Cross Referenced Parts

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
51464
FIIG:
T269-A
Concept No.:
App. Key:
AG
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

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Definition Definition of approved item name (AIN): "Scanning Electron Micr Substrate"

A black opaque item constructed of highly conductive like material designed for use in making ferrograms for microscopic examination.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE ARMY Dept. of the Army
DSOR:
Import / Export
  • Schedule B: 9012900000
  • SITC: 87139
  • End Use: Laboratory testing instruments
  • NAICS: 334516
  • USDA: 1

Classification: Parts and accessories for microscopes other than optical microscopes; diffraction apparatus


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