F577D2

Semiconductor Device Test Set

NSN 6625-00-202-3475

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
N/A
UOM:
1 EA
NIIN:
002023475

Detail Specifications

Ac Voltage Rating:
Between 110.0 volts and 220.0 volts
Major Components:
Standard test fixture, curve tracer, cathode ray tube display
Accessory Component Quantity:
3
Accessory Controlling Agency:
Tektronix inc.
Accessory Identifying Number:
013-0098-01 part no. And 013-0111-00 part no. And 337-1194-00 part no.
Electrical Power Source Relationship:
Operating
Internal Battery Accommodation:
Not included
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
Characteristic curves
Phase:
Single
Functional Classification:
Aa-3.2
Functional Description:
Tests dc, 2 & 3 terminal devices, & 16-pin inline integrated circuit packages w/ appropriate device adapters; displays semiconductor characteristic curves on a c.R.T; has 2 power supplies to drive uut; the resulting current & voltage is plotted on c.R.T. W/ vertical axis displaying current & horizontal displaying voltage; compatible to 177 standard test fixture
Entry Date:
80-09-01
Reference Data And Literature:
Af t.O. 33d7-77-26-1
NSN:
6625-00-202-3475
Item Name:
Test Set,diode Semiconductor Device
Cage Code:
80009

Manufacturer Part Numbers

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
577D2-177
Cage Code:
80009
RNCC:
5
RNVC:
2
RNAAC:
SB
Status:
A
MSDS:
SADC:
Part Number:
577D2MOD177
Cage Code:
80009
RNCC:
5
RNVC:
2
RNAAC:
SB
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
32.5 X 26.5 X 16.5
Paclk Weight:
74.0000lbs
Item Weight:
0.0000lbs
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
F000004I89
SPI Rev.:
SPC Mkg:
19
LVL_A:
LVL_B:

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
72D
TCC:
Z
SHC:
Q
ACC:
Equipment for Aircraft

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Definition Definition of approved item name (AIN): "Diode Semiconductor Device Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE AIR FORCE Dept. of the Air Force
DSOR:
FR
User:
DEPARTMENT OF THE NAVY Dept. of the Navy
DSOR:
JA
User:
BRAZIL Brazil
DSOR:
User:
SPAIN Spain
DSOR:
User:
SINGAPORE Singapore
DSOR:
User:
GERMANY Germany
DSOR:
User:
REPUBLIC OF KOREA Republic of Korea
DSOR:
User:
GREECE Greece
DSOR:
User:
TURKEY Turkey
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


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