A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6220-01-167-7859
NSN 6645-00-776-8234
NSN 6150-01-318-8976
NSN 5950-01-411-6124
NSN 5960-00-675-9373
NSN 6320-00-521-9350
NSN 6685-00-822-9465
NSN 5835-01-550-5094
NSN 6105-01-605-0572
NSN 5920-00-484-3185
NSN 6645-00-684-3424
NSN 6105-01-393-1750