FM110

Electronic Metal Flaw Detector

NSN 6635-00-803-7596

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
UOM:
NIIN:
008037596

Technical Specifications of NSN

End Application:
General purpose use
NSN:
6635-00-803-7596
Item Name:
Test Set,eddy Current
Cage Code:
37676

Other Related Parts

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
60394
FIIG:
T264-B
Concept No.:
App. Key:
BA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
MMAC:
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
14.5 X 14.5 X 16.5
Paclk Weight:
13.0000lbs
Item Weight:
4.8000lbs
Item Dim:
009500700038
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
M
SPI No.:
F000004XA6
SPI Rev.:
SPC Mkg:
03
LVL_A:
LVL_B:

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
658
TCC:
Z
SHC:
Z
ACC:
Equipment for Aircraft

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Pricing & Availability

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Privacy | Terms

Definition Definition of approved item name (AIN): "Eddy Current Test Set"

A non-destructive electromagnetic device which introduces eddy current in a part(s) to be inspected. Changes in the current flow caused by surface variations in the part are reflected into a nearby coil(s) where they are detected and measured by suitable instrumentation which is provided. See also fluorescent penetrant inspection unit; magnetic inspection unit (as modified); transducer, ultrasonic test; x-ray apparatus, radiographic, industrial.

MOE Major Organizational Entities

Entity
DSOR
User:
REPUBLIC OF KOREA Republic of Korea
DSOR:
Import / Export
  • Schedule B: 9027803500
  • SITC: 87446
  • End Use: Laboratory testing instruments
  • NAICS: 334519
  • USDA: 1

Classification: Physical analysis instruments and apparatus, except using optical radiations, nesoi


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