GB932

Eddy Current Probe

NSN 6635-01-288-4340

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
N/A
UOM:
1 EA
NIIN:
012884340

Detail Specifications

Overall Diameter:
0.281 inches
End Application:
4120-01-127-0716
Tip Termination Type:
Probe
NSN:
6635-01-288-4340
Item Name:
Eddy Current Probe
Cage Code:
0VPD4

Manufacturer Part Numbers

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
VM101G 9/32
Cage Code:
60761
RNCC:
3
RNVC:
2
RNAAC:
CX
Status:
A
MSDS:
SADC:
Part Number:
223918
Cage Code:
0U8D5
RNCC:
5
RNVC:
2
RNAAC:
ZZ
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
36329
FIIG:
T228-H
Concept No.:
App. Key:
HA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
N
PMIC:
A
ESD:
ESD:
MMAC:
TG
CRITL:
X

Packaging & Shipping

Est. Pack Size
Est. Pack Weight
Est. Item Weight
Est. Item Dim.
Pack Size:
--
Paclk Weight:
0.1000lbs
Item Weight:
--
Item Dim:
--
OPI
SPI No.
SPI Rev.
SPC Mkg.
LVL A
LVL B
OPI:
O
SPI No.:
SPI Rev.:
SPC Mkg:
00
LVL_A:
E
LVL_B:
Q

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
058240
UFC:
33170
LTL:
150.0
LCL:
--
WCC:
72B
TCC:
Z
SHC:
9
ACC:
Instruments/Radio

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Pricing & Availability

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Privacy | Terms

Definition Definition of approved item name (AIN): "Eddy Current Probe"

An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE AIR FORCE Dept. of the Air Force
DSOR:
Import / Export
  • Schedule B: 9027509000
  • SITC: 87445
  • End Use: Laboratory testing instruments
  • NAICS: 334516
  • USDA: 1

Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi


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