A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6320-01-260-7390
NSN 4140-00-042-6423
NSN 6685-01-347-5281
NSN 5990-01-599-7106
NSN 5985-00-356-7277
NSN 5925-01-045-2119
NSN 5945-01-013-4288
NSN 6135-01-365-2707
NSN 5999-01-620-2285
NSN 5855-01-616-4391
NSN 5935-01-388-9825
NSN 5996-01-067-4125