A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5999-00-849-8714
NSN 5950-01-360-3716
NSN 5920-00-185-9587
NSN 6240-01-415-5581
NSN 6650-00-246-3751
NSN 5998-01-301-2569
NSN 5910-01-660-9223
NSN 6110-01-174-2184
NSN 5920-00-421-0991
NSN 6135-01-177-3552
NSN 6610-01-563-1809
NSN 6620-01-091-1038