HTR1005B

Semiconductor Device Test Set

NSN 6625-01-085-8037

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

010858037

Detail Specifications

Width:

10.000 inches

Ac Voltage Rating:

115.0 volts

Frequency Rating:

60.0 hertz

Major Components:

Tester, solid state; test probes and cables

Depth:

11.250 inches

Electrical Power Source Relationship:

Alternate operating

Internal Battery Accommodation:

Not included

Material And Location:

Plastic housing

Inclosure Feature:

Single item w/housing

Test Type For Which Designed:

Comparitor function, circuit boards with integrated circuits or hybrid circuits; in-circuit testing at low, medium and high impedance; circuit testing for current-limited circuit protection; in-circuit test of solid state components; reliable testing of electrolytic capacitors

Operating Test Capability:

Visual scope display projecting images indicating condition of a device under test

Phase:

Single

Height:

3.375 inches

Surface Treatment:

Plastic

Surface Treatment:

Plastic

NSN:

6625-01-085-8037

Item Name:

Test Set,diode Semiconductor Device

Cage Code:

57705

Manufacturer Part Numbers

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

HTR1005B-1

Cage Code:

57705

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

1005B

Cage Code:

57705

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

1005B-1

Cage Code:

57705

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

25006

FIIG:

T228-A

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

21.0 X 15.0 X 9.5

Paclk Weight:

12.0000lbs

Item Weight:

7.0000lbs

Item Dim:

011001000040

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

F000003XE4

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

77.5

WCC:

738

TCC:

SHC:

ACC:

Instruments/Radio

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100% Genuine Manufacturers Parts
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Sales Record Retention of 7 years
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Pricing & Availability

Submit this form for current pricing and availability quote on part number htr1005b and/or cross reference parts.

Definition Definition of approved item name (AIN): "Diode Semiconductor Device Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.