A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5975-00-377-0650
NSN 5905-01-386-3620
NSN 6645-01-270-3176
NSN 6645-01-363-2519
NSN 5945-01-074-7362
NSN 5998-00-202-2888
NSN 6105-00-914-8323
NSN 5985-00-603-8056
NSN 5915-00-431-4941
NSN 5895-00-401-4917
NSN 6620-00-793-7733
NSN 6620-00-104-5677