JANTX2N2919A

Unitized Semiconductor Devices

NSN 5961-00-170-9887

DEMIL

Shelf Life

UOM

NIIN

Demil:

Shelf Life:

N/A

UOM:

1 EA

NIIN:

001709887

Product Features

All transistor junction pattern arrangement: npn

Detail Specifications

Inclosure Material:

Metal

Overall Length:

0.260 inches

Terminal Length:

0.500 inches

Overall Diameter:

0.370 inches

Component Name And Quantity:

2 transistor

Mounting Method:

Terminal

Semiconductor Material:

Silicon all transistor

Voltage Rating In Volts Per Characteristic:

60.0 collector to base voltage/static/emitter open all transistor and 60.0 collector to emitter voltage/static/base open all transistor and 6.0 emitter to base voltage, static, collector open all transistor

Current Rating Per Characteristic:

30.00 milliamperes source cutoff current all transistor

Power Rating Per Characteristic:

1.25 watts small-signal input power, common-collector preset all transistor

Maximum Operating Tempurature Per Measurement Point:

200.0 degrees celsius junction

Test Data Document:

81349-mil-prf-19500 specification (includes engineering type bulletins, brochures, etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type data on certain environmental and performance requirements and test conditions that are shown as "typical", "average", "", etc.).

Terminal Type And Quantity:

6 uninsulated wire lead

Specification Data:

81349-mil-prf-19500/355 government specification

NSN:

5961-00-170-9887

Item Name:

Common Cathode Matrix

Cage Code:

81349

Manufacturer Part Numbers

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

JANTX2N2919

Cage Code:

81349

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

MIL-PRF-19500/355

Cage Code:

81349

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

352-7500-931

Cage Code:

13499

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

ND07501

Cage Code:

27014

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

61962

FIIG:

A110A0

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

Paclk Weight:

0.1000lbs

Item Weight:

Item Dim:

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

063025

UFC:

34525

LTL:

RATING VARIABLE

LCL:

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

We Guarantee with Every Order

100% Genuine Manufacturers Parts
Every Product thoroughly Inspected
Sales Record Retention of 7 years
Fast Delivery
HAZMAT Certified
Global Shipping

Pricing & Availability

Submit this form for current pricing and availability quote on part number jantx2n2919a and/or cross reference parts.

Definition Definition of approved item name (AIN): "Common Cathode Matrix"

Two or more discrete semiconductor devices such as diode(s) and/or transistor(s), permanently cased, encapsulated, or potted together to form an inseparable unit. Excludes devices having one or more components other than semiconductor devices. The individually distinct devices forming the unit may be internally connected. The unit in itself does not perform a complete specific function and cannot be assigned a more definite item name. It may include or consist of inseparable matched pairs. May or may not include mounting hardware and/or heatsink. For interconnected items arranged in stack(s), see rectifier, semiconductor device. For items formed on or within a semiconductor material substrate, formed on an insulating substrate or formed on a combination of both of these types, see microcircuit (as modified). Excludes network (as modified); absorber, overvoltage; semiconductor device set; and semiconductor device assembly. Do not use if more specific name applies.