P530

Test Probe

NSN 6625-01-059-4279

DEMIL

Shelf Life

UOM

NIIN

Demil:

DEMIL/MLI

Shelf Life:

N/A

UOM:

1 EA

NIIN:

010594279

Detail Specifications

End Application:

2350-01-087-1095 tank, cmbt, m1a1

Circuit Type:

Amplifier

Tip Termination Type:

Probe

Conductor Attachment Method:

The probe is fitted with a spring of sufficient strength to insure firm closure about a conductor in the presence of twisting induced by the weight of the probe and a flexible multiconductor cable attached to the probe

Tip Replaceability Feature:

Not included

NSN:

6625-01-059-4279

Item Name:

Body,probe

Cage Code:

18479

Manufacturer Part Numbers

Part Number

Cage

RNCC

RNVC

RNAAC

Status

MSDS

SADC

Part Number:

12258878

Cage Code:

19207

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

10087446

Cage Code:

A486G

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

6625010594279

Cage Code:

SCY13

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Number:

12258878

Cage Code:

18479

RNCC:

RNVC:

RNAAC:

Status:

MSDS:

SADC:

Part Identification

INC

FIIG

Concept No.

App. Key

Cond. Code

Status

INC:

39886

FIIG:

T228-H

Concept No.:

App. Key:

Cond. Code:

Status:

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators

HMIC

PMIC

ESD/EMI

ENAC

MMAC

CRITL

HMIC:

PMIC:

ESD:

MMAC:

CRITL:

Packaging & Shipping

Est. Pack Size

Est. Pack Weight

Est. Item Weight

Est. Item Dim.

Pack Size:

11.0 X 2.8 X 1.8

Paclk Weight:

2.5000lbs

Item Weight:

Item Dim:

010700250015

OPI

SPI No.

SPI Rev.

SPC Mkg.

LVL A

LVL B

OPI:

SPI No.:

SPI Rev.:

SPC Mkg:

LVL_A:

LVL_B:

Freight Classification

NMFC

UFC

LTL

LCL

WCC

TCC

SHC

ACC

NMFC:

061700

UFC:

34580

LTL:

RATING VARIABLE

LCL:

85.0

WCC:

658

TCC:

SHC:

ACC:

Instruments/Radio

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Pricing & Availability

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Definition Definition of approved item name (AIN): "Probe Body"

An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes probe-lead assembly, test and test probe attachment.