PD09WRGBEC24

Semiconductor Device Test Set

NSN 6625-01-577-7189

DEMIL
Shelf Life
UOM
NIIN
Demil:
DEMIL/MLI
Shelf Life:
N/A
UOM:
1 EA
NIIN:
015777189

Product Features

Meets mil-prf-28800 class 3

Product Technical Spec.

Ac Voltage Rating:
110.0 volts or 240.0 volts
Frequency Rating:
Between 50.0 hertz and 400.0 hertz
Major Components:
Test set; pair microprobes; common test leads; shrouded test lead; power cord; cd manual
Accessory Component Quantity:
5
Electrical Power Source Relationship:
Operating
Internal Battery Accommodation:
Not included
Inclosure Feature:
Single item w/housing
Test Type For Which Designed:
In-circuit electronic component testing
Part Name Assigned By Controlling Agency:
Test set, semiconductor
Phase:
Single
Functional Classification:
Aa-9.6
Functional Description:
Used to in-circuit test semiconductor components
Entry Date:
09-09-08
Purchase Description Identification:
98752-pd09wrgbec24
NSN:
6625-01-577-7189
Item Name:
Test Set,crystal Diode
Cage Code:
98752

Cross Referenced Parts

Part Number
Cage
RNCC
RNVC
RNAAC
Status
MSDS
SADC
Part Number:
MIL-HDBK-300(ATS)
Cage Code:
1HBK1
RNCC:
5
RNVC:
1
RNAAC:
ZZ
Status:
A
MSDS:
SADC:

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
ESD:
MMAC:
RH
CRITL:
X

Freight Classification

NMFC
UFC
LTL
LCL
WCC
TCC
SHC
ACC
NMFC:
061700
UFC:
34580
LTL:
RATING VARIABLE
LCL:
77.5
WCC:
738
TCC:
3
SHC:
9
ACC:
Instruments/Radio

  We Guarantee with Every Order

  •   100% Genuine Manufacturers Parts
  •   Every Product thoroughly Inspected
  •   Sales Record Retention of 7 years
  •   Fast Delivery
  •   HAZMAT Certified
  •   Global Shipping

Pricing & Availability

Submit this form for current pricing and availability quote on part number pd09wrgbec24 and/or cross reference parts.
Part / NSN:
Qty:
Your Email:
Phone:
Ref. / PO #:
Company:

We do not share or sell your information to anyone.
Privacy | Terms

Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
DEPARTMENT OF THE AIR FORCE Dept. of the Air Force
DSOR:
FR
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


Best-Selling Products A collection of our most popular products