PROTRACKIMODEL10

Semiconductor Device Test Set

NSN 6625-01-451-1404

DEMIL
Shelf Life
UOM
NIIN
Demil:
NO
Shelf Life:
UOM:
NIIN:
014511404

Detail Specifications

Inclosure Feature:
Single item w/housing
NSN:
6625-01-451-1404
Item Name:
Test Set,crystal Diode
Cage Code:
57705

Manufacturer Part Numbers

No other part numbers with same form, fit, and function found.

Part Identification

INC
FIIG
Concept No.
App. Key
Cond. Code
Status
INC:
25006
FIIG:
T228-A
Concept No.:
1
App. Key:
AA
Cond. Code:
1
Status:
A

Part Materials

Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicators
HMIC
PMIC
ESD/EMI
ENAC
MMAC
CRITL
HMIC:
P
PMIC:
A
ESD:
A
ESD:
A
MMAC:
CRITL:
X

  We Guarantee with Every Order

  •   100% Genuine Manufacturers Parts
  •   Every Product thoroughly Inspected
  •   Sales Record Retention of 7 years
  •   Fast Delivery
  •   HAZMAT Certified
  •   Global Shipping

Pricing & Availability

Submit this form for current pricing and availability quote on part number protrackimodel10 and/or cross reference parts.
Part / NSN:
Qty:
Your Email:
Phone:
Ref. / PO #:
Company:

We do not share or sell your information to anyone.
Privacy | Terms

Definition Definition of approved item name (AIN): "Crystal Diode Test Set"

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

MOE Major Organizational Entities

Entity
DSOR
User:
NETHERLANDS Netherlands
DSOR:
Import / Export
  • Schedule B: 9030908030
  • SITC: 87479
  • End Use: Measuring, testing, control instruments
  • NAICS: 334515
  • USDA: 1

Classification: Parts and accessories of articles of schedule b subheading 9030.39


Best-Selling Products A collection of our most popular products