Unit requires ibm compatible compter and monitor; probe inputs: 2 banana jacks and 1 bnc connector; scanner inputs: 16, 30, 40, and 64 input connections; rs232 interface at 9600 baud; database management system for failure history and statistical reports
No other part numbers with same form, fit, and function found.
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 7035-01-589-2629
NSN 6320-01-250-0290
NSN 6240-00-526-0243
NSN 7035-01-169-6551
NSN 7035-01-393-6015
NSN 5920-01-527-3759
NSN 6650-01-566-1573
NSN 6110-01-353-0619
NSN 5925-01-415-3640
NSN 6610-01-096-0894
NSN 6240-00-070-6615
NSN 7035-01-322-8180