Unit requires ibm compatible compter and monitor; probe inputs: 2 banana jacks and 1 bnc connector; scanner inputs: 16, 30, 40, and 64 input connections; rs232 interface at 9600 baud; database management system for failure history and statistical reports
No other part numbers with same form, fit, and function found.
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6135-01-483-5269
NSN 5985-01-384-2520
NSN 6320-01-631-7828
NSN 4140-00-823-9194
NSN 6645-01-394-7544
NSN 5925-01-075-7964
NSN 6105-01-659-2444
NSN 6135-01-604-8739
NSN 5935-01-391-7781
NSN 5975-00-690-1080
NSN 5910-00-997-2168
NSN 5985-01-364-1944