Unit requires ibm compatible compter and monitor; probe inputs: 2 banana jacks and 1 bnc connector; scanner inputs: 16, 30, 40, and 64 input connections; rs232 interface at 9600 baud; database management system for failure history and statistical reports
No other part numbers with same form, fit, and function found.
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 5998-01-337-1538
NSN 4140-01-502-3345
NSN 6220-01-528-7232
NSN 6220-01-288-0416
NSN 5975-01-201-4108
NSN 5985-01-403-2835
NSN 5835-01-313-3375
NSN 4140-01-448-9725
NSN 5996-01-473-2183
NSN 5965-01-591-8060
NSN 5999-01-521-3919
NSN 6110-01-476-5028