A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Classification: Parts and accessories of articles of schedule b subheading 9030.39
NSN 6130-01-422-7996
NSN 5998-01-390-7061
NSN 6110-00-299-0260
NSN 5915-01-607-4773
NSN 5895-01-268-6064
NSN 5950-00-619-5781
NSN 5965-01-286-6548
NSN 5996-00-248-7061
NSN 4140-00-844-9436
NSN 5925-01-162-6321
NSN 6610-01-016-3566
NSN 6135-01-041-3829