0.218 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6220-00-531-6430
NSN 2925-00-115-5857
NSN 6645-01-459-7788
NSN 6110-00-421-7656
NSN 5950-01-610-7695
NSN 6145-01-142-0068
NSN 6220-01-548-1661
NSN 5855-01-125-9167
NSN 5999-01-116-1691
NSN 5905-01-421-1239
NSN 5915-00-584-3512
NSN 6145-01-322-5520