0.424 probe tip dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 2925-01-079-6229
NSN 5855-00-862-3345
NSN 5915-00-811-5443
NSN 5925-01-193-6056
NSN 6620-01-230-0197
NSN 5930-00-077-3187
NSN 5975-01-526-3741
NSN 5965-01-202-1007
NSN 6610-00-416-9329
NSN 5996-01-076-1662
NSN 5960-01-086-3416
NSN 5930-01-589-6206