Semiconductor wafer inspection lamp with yellow filter, 100 watt bulb & 8 ft primary & secondary cord
An item specifically designed for use in determining the existence of seams, cracks and other types of flaws in metals. It consists of an ultraviolet light source such as a mercury-vapor lamp, in a housing usually incorportating a pistol-grip handle, and a filter for the exclusion of visible light. See also detector, metal flaw, electronic.
Classification: Ultraviolet lamps
NSN 6150-00-731-9564
NSN 6220-00-269-3783
NSN 6620-00-488-0626
NSN 6220-01-620-7559
NSN 5855-00-256-5562
NSN 6240-01-553-0561
NSN 5975-01-049-2927
NSN 5965-01-303-5724
NSN 6105-01-401-5361
NSN 6240-01-197-6064
NSN 6685-01-163-3715
NSN 6135-01-601-4799